Alabama Analytical Research Center
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Welcome to the University of Alabama FBS Online Portal. This site is designed to automate the use of our Core Facilities and to provide the best possible customer service. Quick Info
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Main Contact Info
Robert Holler
1017 Tom Bevill Building
201 7th Avenue
Tuscaloosa, AL 35487
Remittance Contact Info
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The following Products and Services are available within our facility:
Instruments
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Bruker XRDThis unit is equipped with a centric Eulerian cradle and a Vantec 500 area detector. This combination gives the Bruker D8 Discover the capability to handle tasks such as phase identification and quantification, textural and residual stress analysis, single crystal diffraction, determination of particle size, percent crystallinity, and structural identification. |
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Cameca Leap 5000Cameca LEAP 5000 - The LEAP 5000 is CAMECA's cutting-edge atom probe microscope, offering superior detection efficiency across a wide variety of metals, semiconductors and insulators: more than 40% extra atoms detected per nm3 analyzed. |
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FEI Quanta 200FEI Quanta 200 3D FIB/SEM - Quanta scanning electron microscopes feature three modes (high vacuum, low vacuum, and ESEM) to accommodate the widest range of samples of any SEM system. All Quanta SEM systems can be equipped with analytical systems, such as energy dispersive spectrometer, wavelength dispersive x-ray spectroscopy, and electron backscatter diffraction. |
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FEI Tecnai F20FEI TECNAI F20 TEM - F20 TEM enables a wider range of users to access powerful 3D characterization capabilities for biological and biomaterials samples with a fully digital interface, class-leading ergonomics, and remote control features. |
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Iproto XRDiProto XRD - Characterize the physical surface properties of your thin films, multilayer coatings, and interfaces. |
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JEOL 7000 SEMJEOL 7000 SEM - It is equipped with a large chamber, high and low vacuum modes, secondary and backscatter electron detectors, real-time 3D imaging, highly-advanced auto functions and the option to add a fully embedded EDS with real-time, ‘Live’ analysis. |
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JOEL 8600JEOL 8600 Microprobe - The WD/ED combined system can simultaneously analyze up to 5 WDS elements and all EDS elements. The backscattered electron image, provided by a highly sensitive solid state detector, the secondary electron image, and optional cathodoluminescence image can all be displayed and viewed at the same time. |
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Tescan Lyra XMUTescan Lyra XMU FIB-SEM - Focused ion beam scanning electron microscopy combines two beams (electron and ion) in one instrument. The FIB column is used for cross sectioning or sample modification, while the SEM column provides high resolution imaging, in many instances concurrent with FIB milling. |
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ThermoFisher ApreoThermoFisher Apreo SEM - The Apreo SEM's revolutionary compound lens design combines electrostatic and magnetic immersion technology to yield unprecedented resolution and signal selection. |
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