This unit is equipped with a centric Eulerian cradle and a Vantec 500 area detector. This combination gives the Bruker D8 Discover the capability to handle tasks such as phase identification and quantification, textural and residual stress analysis, single crystal diffraction, determination of particle size, percent crystallinity, and structural identification.

Cameca LEAP 5000 - The LEAP 5000 is CAMECA's cutting-edge atom probe microscope, offering superior detection efficiency across a wide variety of metals, semiconductors and insulators: more than 40% extra atoms detected per nm3 analyzed.

JEOL 7000 SEM - It is equipped with a large chamber, secondary and backscatter electron detectors, highly-advanced auto functions and the option to add a fully embedded EDS with real-time, ‘Live’ analysis.

Proto iXRD - Residual stress measurements of materials

Tescan Lyra XMU FIB-SEM - Focused ion beam scanning electron microscopy combines two beams (electron and ion) in one instrument. The FIB column is used for cross sectioning or sample modification, while the SEM column provides high resolution imaging, in many instances concurrent with FIB milling.

ThermoFisher Apreo SEM - The Apreo SEM's revolutionary compound lens design combines electrostatic and magnetic immersion technology to yield unprecedented resolution and signal selection.